IEC-62607-5-3 › Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices . Measurements of charge carrier concentration
IEC-62607-5-3
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EDITION 1.0
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CURRENT
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IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
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Document Number
IEC/TS 62607-5-3 Ed. 1.0 en:2020
Revision Level
EDITION 1.0
Status
Current
Publication Date
April 1, 2020
Committee Number
113