IEC-62878-2-2 Device embedded substrate - Part 2-2: Guidelines - Electrical testing

IEC-62878-2-2 - EDITION 1.0 - CURRENT

Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.



Want this as a site license?

To find similar documents by classification:

31.180 (Printed circuits and boards)

31.190 (Electronic component assemblies Including preassembled modules)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC/TR 62878-2-2 Ed. 1.0 b:2015

Revision Level




Publication Date

Dec. 1, 2015

Committee Number