IEC-62878-2-4 Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

IEC-62878-2-4 - EDITION 1.0 - CURRENT

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IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.



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31.180 (Printed circuits and boards)

31.190 (Electronic component assemblies Including preassembled modules)

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Document Number

IEC/TS 62878-2-4 Ed. 1.0 b:2015

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Publication Date

March 27, 2015

Committee Number