IEC-62899-503-1 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC-62899-503-1 - EDITION 1.0 - CURRENT


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IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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29.045 (Semiconducting materials)

31.080.30 (Transistors)

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Document Number

IEC 62899-503-1 Ed. 1.0 en:2020

Revision Level

EDITION 1.0

Status

Current

Publication Date

May 1, 2020

Committee Number

119