IEC-62951-3 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

IEC-62951-3 - EDITION 1.0 - CURRENT


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IECĀ 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
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Document Number

IEC 62951-3 Ed. 1.0 en:2018

Revision Level

EDITION 1.0

Status

Current

Publication Date

Nov. 1, 2018

Committee Number

47