IEC-62951-6 › Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
IEC-62951-6
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EDITION 1.0
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CURRENT
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IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
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31.080.99 (Other semiconductor devices)
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Document Number
IEC 62951-6 Ed. 1.0 b:2019
Revision Level
EDITION 1.0
Status
Current
Publication Date
May 1, 2019
Committee Number
47