IEC-62951-9 › Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

IEC-62951-9 - EDITION 1.0 - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.
ORDER

Price:

$143.56        


Want this as a site license?

To find similar documents by classification:

31.080.99 (Other semiconductor devices)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC 62951-9 Ed. 1.0 en:2022

Revision Level

EDITION 1.0

Status

Current

Publication Date

Dec. 1, 2022

Committee Number

47