IEC-63133 › Semiconductor devices - Scan based ageing level estimation for semiconductor devices

IEC-63133 - EDITION 1.0 - CURRENT


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IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
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Document Number

IEC/TR 63133 Ed. 1.0 en:2017

Revision Level

EDITION 1.0

Status

Current

Publication Date

Oct. 1, 2017

Committee Number

47