IEC-63342 C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection

IEC-63342 - EDITION 1.0 - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.
ORDER

Price:

$99.91        


Want this as a site license?

To find similar documents by classification:

27.160 (Solar energy engineering Including photovoltaic energy systems)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC/TS 63342 Ed. 1.0 en:2022

Revision Level

EDITION 1.0

Status

Current

Publication Date

July 1, 2022

Committee Number

82