IEC-68-2-29 | Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump | Document Center, Inc.

IEC-68-2-29 › Complete Document History
Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump

Obsolete Revision Information:

2ND EDITION CORRIGENDUM 1 - CORRIGENDUM FOR 2ND EDITION - Oct. 1, 1987
2ND EDITION - WITHDRAWN IN 2008 - March 1, 1987