IEC/PAS-62162 Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

IEC/PAS-62162 - 2000 EDITION - SUPERSEDED
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Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
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Document Number

IEC/PAS 62162 Ed. 1.0 en:2000

Revision Level

2000 EDITION

Status

Superseded

Publication Date

Aug. 1, 2000

Committee Number

47