ISO-16526-3 › Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3: Spectrometric method

ISO-16526-3 - 1ST EDITION - CURRENT


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ISO 16526-3:2011 specifies the test method for a non-invasive measurement of X-ray tube voltages using the energy spectrum of X-rays (spectrometric method). It covers the voltage range from 10 kV to 500 kV.

The intention is to check the correspondence of the actual voltage with the indicated value on the control panel of the X-ray unit. It is intended to measure the maximum energy only and not the complete X-ray spectrum.

The procedure is applicable for tank type and constant potential X-ray units.

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19.100 (Non-destructive testing Including testing equipment: industrial apparatus for X-ray and gamma radiography, penetrant flaw detectors, etc. Non-destructive testing of welded joints, see 25.160.40 Industrial radiographic films, see 37.040.25 Non-destructive testing of metals, see 77.040.20)

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Document Number

ISO 16526-3:2011

Revision Level

1ST EDITION

Status

Current

Publication Date

Dec. 15, 2011

Committee Number

ISO/TC 135/SC 5