ISO-17915 Optics and photonics - Measurement method of semiconductor lasers for sensing

ISO-17915 - 1ST EDITION - CURRENT
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This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

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31.260 (Optoelectronics. Laser equipment Including photoelectric tubes and cells)

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Document Number

ISO 17915:2018

Revision Level

1ST EDITION

Status

Current

Publication Date

May 1, 2018

Committee Number

ISO/TC 172/SC 9