ISO-18452 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

ISO-18452 - 1ST EDITION - CURRENT


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ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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Document Number

ISO 18452:2005

Revision Level

1ST EDITION

Status

Current

Publication Date

Nov. 15, 2005

Committee Number

ISO/TC 206