ISO-18452 › Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
ISO-18452
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1ST EDITION
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CURRENT
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ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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Document Number
ISO 18452:2005
Revision Level
1ST EDITION
Status
Current
Publication Date
Nov. 15, 2005
Committee Number
ISO/TC 206