ISO-24688 › Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
ISO-24688
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1ST EDITION
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CURRENT
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This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
To find similar documents by classification:
25.220.01 (Surface treatment and coating in general)
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Document Number
ISO 24688:2022
Revision Level
1ST EDITION
Status
Current
Publication Date
July 1, 2022
Committee Number
ISO/TC 107/SC 9