ISO-6342 › Micrographics - Aperture cards - Method of measuring thickness of buildup area

ISO-6342 - 2ND EDITION - CURRENT
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ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

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37.080 (Document imaging applications Including micrographic, electronic and optical applications Optical storage devices, see 35.220.30)

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Document Number

ISO 6342:2003

Revision Level

2ND EDITION

Status

Current

Publication Date

July 1, 2003

Committee Number

ISO/TC 171/SC 2