JESD-35 Complete Document History
Procedure for Wafer-Level-Testing of Thin Dielectrics

Complete Current Edition:
   REVISION A - PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS - April 1, 2001

Obsolete Revision Information:
   FOR ADDENDUM 2 SEE - JESD-35-2 - Feb. 26, 1996
   FOR ADDENDUM 1 SEE - JESD-35-1 - Sept. 1, 1995
   BASE - PROCEDURE FOR THE WAFER-LEVEL - July 1, 1992