PD-IEC/PAS-62276 › Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

PD-IEC/PAS-62276 - 2002 EDITION - SUPERSEDED -- See the following: BS-EN-62276
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Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

Keywords

Crystals (electronic);Acoustoelectric devices;Acoustic waves;Electronic equipment and components;Crystal resonators;Acoustic filters;Resonators;Electromechanical filters;Dielectric devices;Lithium;Electrical wave measurement;Acoustic measurement;Quartz;Acoustic wave devices;Piezoelectric devices;Substrates (insulating)

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31.140 (Piezoelectric devices)

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Document Number

PD IEC/PAS 62276:2002

Revision Level

2002 EDITION

Status

Superseded

Publication Date

Feb. 5, 2002

Replaced By

BS EN 62276:2005

Page Count

40

ISBN

0580389804

International Equivalent

IEC PAS 62276:2001

Committee Number

W/-