PD-ISO-17915 › Optics and photonics. Measurement method of semiconductor lasers for sensing
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Optics and photonics. Measurement method of semiconductor lasers for sensing
Keywords
Optics;Phase;Optical measurement;Lasers;Polarization (wave physics);Phase shift;Wave properties and phenomena;Optical instruments
To find similar documents by classification:
31.260 (Optoelectronics. Laser equipment Including photoelectric tubes and cells)
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Document Number
PD ISO/TS 17915:2013
Revision Level
2013 EDITION
Status
Superseded
Publication Date
July 31, 2013
Replaced By
BS ISO 17915:2018
Page Count
36
ISBN
9780580811296
International Equivalent
ISO/TS 17915:2013
Committee Number
CPW/172