SIS-CEN/TR-10354 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

SIS-CEN/TR-10354 - 2011 EDITION - CURRENT


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This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials. The method is applicable to: - Si contents between 40 % and 90 %; - Al contents between 0,5 % and 6 %. The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines: - Si Ka 7.126 (for element contents between 45 % and 90 %); - Al Ka 8.339 (for element contents between 0,8 % and 6 %); - Fe Ka 1.937 (for element contents between 10 % and 58 %). NOTE For matrix matching purposes, iron is included in the analytical program to be prepared. Within the conditions here above, spectral interferences don’t need to be calculated.

To find similar documents by classification:

71.040.30 (Chemical reagents Including reference materials)

77.040.30 (Chemical analysis of metals Chemical analysis in general, see 71.040.40 Chemical analysis of ferrous metals, see 77.080 Chemical analysis of ferroalloys, see 77.100 Chemical analysis of non-ferrous metals, see 77.120 Chemical analysis of sintered metals and hard metals, see 77.160)

77.080.10 (Irons)

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Designation Name

SIS-CEN/TR 10354:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Nov. 10, 2011

Language(s)

English

Page Count

28