SIS-CEN/TR-10354 › Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
SIS-CEN/TR-10354
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2011 EDITION
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CURRENT
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This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials. The method is applicable to: - Si contents between 40 % and 90 %; - Al contents between 0,5 % and 6 %. The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines: - Si Ka 7.126 (for element contents between 45 % and 90 %); - Al Ka 8.339 (for element contents between 0,8 % and 6 %); - Fe Ka 1.937 (for element contents between 10 % and 58 %). NOTE For matrix matching purposes, iron is included in the analytical program to be prepared. Within the conditions here above, spectral interferences dont need to be calculated.
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Designation Name
SIS-CEN/TR 10354:2011
Revision Level
2011 EDITION
Status
Current
Publication Date
Nov. 10, 2011
Language(s)
English
Page Count
28