SS-EN-ISO-18452 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

SS-EN-ISO-18452 - 2016 EDITION - CURRENT


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This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10nm to 10 000 nm.NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.

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81.060.30 (Advanced ceramics)

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Designation Name

SS-EN ISO 18452:2016

Revision Level

2016 EDITION

Status

Current

Publication Date

April 25, 2016

Language(s)

English

Page Count

24

International Equivalent

EN ISO 18452:2016(IDT); ISO 18452:2005(IDT)