SS-EN-ISO-18452 › Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)
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This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10nm to 10 000 nm.NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.
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SS-EN ISO 18452:2016
April 25, 2016
EN ISO 18452:2016(IDT); ISO 18452:2005(IDT)