SS-ISO-6342 Micrographics - Aperture cards - Method of measuring thickness of buildup area

SS-ISO-6342 - EDITION 1 - CURRENT


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Micrographics - Aperture cards - Method of measuring thickness of buildup area

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37.080 (Document imaging applications Including micrographic, electronic and optical applications Optical storage devices, see 35.220.30)

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Designation Name

SS-ISO 6342

Revision Level

EDITION 1

Status

Current

Publication Date

Aug. 31, 1993

Language(s)

English

Page Count

4

International Equivalent

ISO 6342:1993 IDT