ASTM-F59 › Method for Identification of Metal Particulate Contamination Found in Electronic and Microelectronic Components and Systems Using the Ring Oven Technique, With Spot Tests (Withdrawn 1994)

ASTM-F59 - 1968 EDITION - CANCELLED
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Method for Identification of Metal Particulate Contamination Found in Electronic and Microelectronic Components and Systems Using the Ring Oven Technique, With Spot Tests (Withdrawn 1994)
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Keywords

ICS Number Code 31.020 (Electronic components in general); 31.200 (Integrated circuits. Microelectronics)

To find similar documents by classification:

31.020 (Electronic components in general Magnetic components, see 29.100.10)

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

ASTM-F59-68(1988)

Revision Level

1968 EDITION

Status

Cancelled

Modification Type

Withdrawn

Publication Date

Aug. 15, 1968

Document Type

Test Method

Page Count

6 pages