BS-ISO-11938 › Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

BS-ISO-11938 - 2012 EDITION - CURRENT


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Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

Keywords

Spectroscopy;X-ray fluorescence spectrometry;Semiconductor diodes;Chemical analysis and testing;Semiconductors;Detectors;Electron beams

To find similar documents by classification:

71.040.50 (Physicochemical methods of analysis Including spectrophotometric and chromatographic analysis)

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Document Number

BS ISO 11938:2012

Revision Level

2012 EDITION

Status

Current

Publication Date

April 30, 2013

Page Count

22

ISBN

9780580637148

International Equivalent

ISO 11938:2012

Committee Number

CII/9