BS-ISO-20263 › Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

BS-ISO-20263 - 2017 EDITION - CURRENT


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Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

Keywords

Electron microscopes;Materials by form;Analysis;Interfaces;Measurement

To find similar documents by classification:

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

71.040.50 (Physicochemical methods of analysis Including spectrophotometric and chromatographic analysis)

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Document Number

BS ISO 20263:2017

Revision Level

2017 EDITION

Status

Current

Publication Date

Jan. 4, 2018

Page Count

54

ISBN

9780580893452

International Equivalent

ISO 20263:2017

Committee Number

CII/9