BS-ISO-24173-TC › Tracked Changes. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS-ISO-24173-TC
-
2024 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Tracked Changes. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Keywords
Test specimens;Crystal structure;Measurement;Chemical analysis and testing;Microanalysis;Electron beams;Diffraction;Electron microscopes;Orientation;Crystallography
To find similar documents by classification:
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS ISO 24173:2024 - TC
Revision Level
2024 EDITION
Status
Current
Publication Date
Feb. 22, 2024
Page Count
126
ISBN
9780539306941
Committee Number
CII/9