FSC 59GP: Electrical and Electronic Equipment Components -- General
The following documents are a part of this series:ASTM:
US GOVERNMENT DOCUMENTS:
- AMS-5855 - Alloy Powder, Corrosion & Heat Resistant 59.5NI-12Cr-10Co-3.0mo-6.0W-3.0Ti-1.5TA-4.5al-0.0
- DESC-DWG-84081 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- DESC-DWG-84083 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Herme
- DESC-DWG-84084 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermetically Sealed
- DESC-DWG-86131 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Nonhermetically Sealed
- DESC-DWG-88010 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- DESC-DWG-88051 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Nonhermetically Sealed
- DESC-DWG-98024 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermetically Sealed
- DSCC-98024 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- EIA-359 - EIA Standard Colors for Color Identification and Coding
- EIA-359(BINDER) - Color Charts for Color Coding
- EIA-554 - Method Selection for Assessment of Nonconforming Levels in Parts Per Million (PPM)
- EIA-557 - Statistical Process Control Systems
- EIA-557-1 - Guidance for the Selection of Critical Manufacturing Operations for Use in Implementin
- EIA-584 - Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of A Continuous Manufacturing Process (STABILIZED Jul 2015)
- EIA-585 - Zero Acceptance Number Sampling Procedures and Table for Inspection by Attributes of Isolated Lots
- EIA-738 - Guideline on the Use and Application of CPK (STABILIZED May 2016)
- IEEE-C37.30 - Standard Requirements for High-Voltage Switches
- IPC/EIA-J-STD-002 - Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires
- IPC-J-STD-609 - IPC/JEDEC Marking and Labeling of Components, PCBs and PCBAs to Identify Lead (Pb), Lead-Free (Pb-Free) and Other Attributes
- MIL-C-21743 - Composite Electronic Components General Specification
- MIL-C-28790 - Circulators, Radio Frequency, General Specification for (Superseded by MIL-DTL-28791)
- MIL-E-17362 - Electronic Repair Part Requirement, Procedure for Provisioning Technical Documentation & Stock Numbering
- MIL-E-24762 - Enclosures for Electronic Equipment, Survivable, Naval Shipboard Use
- MIL-E-5135 - Electronic-Standard-Items; Part, Material and Process (No Superseding Document)
- MIL-F-15733/34 - Filters & Capacitors, Radio Frequency Interference, Hermetically Sealed, Style Fl90
- MIL-F-28861/10 - Filters & Capicitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- MIL-F-28861/12 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- MIL-F-28861/13 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- MIL-F-28861/14 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- MIL-F-28861/15 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppresion, Hermeti
- MIL-F-28861/16 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermetically Sealed, Style Fs66 (No Superseding Document)
- MIL-F-28861/17 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermetically Sealed, Style Fs67 (No Superseding Document)
- MIL-F-28861/18 - Filters & Capacitors Radio Frequency/Electromagnetic Interference Supression, Hermetic
- MIL-F-28861/6 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Nonher
- MIL-F-28861/7 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Nonh
- MIL-F-28861/8 - Filters & Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermet
- MIL-F-28861/9 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Nonh
- MIL-F-28861/COMPLETE - Complete Set of Current Slash Sheets for MIL-F-28861
- MIL-G-16560 - Gas Discharges in Tr and Attenuator Tubes, Study Of
- MIL-HDBK-279 - Total Dose Hardness Assurance Guideline for Semiconductor Device and Microcircuit (Superseded by MIL-HDBK-814)
- MIL-HDBK-280 - Neutron Hardness Assurance Guidelines for Semiconductor Devices and Microcircuits (Superseded by MIL-HDBK-814)
- MIL-HDBK-5961 - Military Handbook, List of Standard Semiconductor Devices
- MIL-HDBK-600 - Guidelines for Identification, Marking, Labeling, Storage, and Transportation of Radioactive Commodities (See Notice for Replacement Information)
- MIL-HDBK-6100 - List of Case Outlines and Dimensions for Discrete Semiconductor Devices (No Superseding Document)
- MIL-HDBK-814 - Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
- MIL-HDBK-815 - Dose-Rate Hardness Assurance Guidelines
- MIL-HDBK-816 - Guidelines for Developing Radiation Hardness Assurance Device Specifications
- MIL-HDBK-817 - System Development Radiation Hardness Assurance
- MIL-HDBK-978 - Nasa Parts Application Handbook W/Volumes 1-5 (No Superseding Document)
- MIL-HDBK-978/1 - Nasa Parts Application Handbook Volume 1 (Cancelled, 1995, No Superseding Document)
- MIL-HDBK-978/2 - Nasa Parts Application Handbook Volume 2 (Cancelled, 1995, No Superseding Document)
- MIL-HDBK-978/3 - Nasa Parts Application Handbook/Microcircuits Volume 3 of 5 (Cancelled, 1995, No Superseding D
- MIL-HDBK-978/4 - Nasa Parts Application Handbook/Crystals, Filters, (Cancelled, 1995, No Superseding Document)
- MIL-HDBK-978/5 - Nasa Parts Application Handbook/Connectors, Protective Devices (Canc, 1995, No Superseding Doc
- MIL-HDBK-979 - Nasa Standard Parts, Data Sheets for (No Superseding Document)
- MIL-L-8050 - Lobe Switch, Antenna Sa&314( )-Apx
- MIL-PRF-15733 - Filters and Capacitors, Radio Frequency Interference, General Specification for
- MIL-PRF-15733/27 - Filters and Capacitors, Radio Frequency Interference, Hermetically Sealed, Style FL15
- MIL-PRF-15733/34 - Filters and Capacitors, Radio Frequency Interference, Hermetically Sealed, Style FL90
- MIL-PRF-15733/49 - Filters and Capacitors, Radio Frequency Interference, Hermetically Sealed, Style FL93
- MIL-PRF-15733/58 - Filters and Capacitors, Radio Frequency Interference, Hermetically Sealed, Style FL63
- MIL-PRF-28861 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, General Specification for
- MIL-PRF-28861/1 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, Hermetically Sealed, Styles FS10 and FS11
- MIL-PRF-28861/10 - See: MIL-F-28861/10
- MIL-PRF-28861/12 - Filters, and Capacitors, Radio Frequency/Electromagnetic Interference, Suppression, Hermetically Sealed on One End Only, Style FS70
- MIL-PRF-28861/13 - See: MIL-F-28861/13
- MIL-PRF-28861/14 - See: MIL-F-28861/14
- MIL-PRF-28861/15 - See: MIL-F-28861/15
- MIL-PRF-28861/18 - See: MIL-F-28861/18
- MIL-PRF-28861/6 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference, Suppression, Nonhermetically Sealed, Style FS60
- MIL-PRF-28861/7 - See: MIL-F-28861/7
- MIL-PRF-28861/8 - See: MIL-F-28861/8
- MIL-PRF-28861/9 - See: MIL-F-28861/9
- MIL-PRF-28861/COMPLE - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, General Specification for - Complete Set of Current Slash Sheets - Special Quote
- MIL-PRF-83401 - Resistor Network, Fixed, Film, and Capacitor-Resistor Network, Ceramic Capacitor and Fixed, Film, Resistor, General Specification for
- MIL-R-19610 - Reliability of Production Electronic Equipment General Specification For
- MIL-R-22256 - Relialibility Requirements for Design of Electronic Equipment or Systems (Superseded by MIL-STD-785)
- MIL-R-38100 - Reliability and Quality Assurance Requirements for Established Reliability Parts, General Specification For
- MIL-STD-1285 - Marking of Electrical and Electronic Parts
- MIL-STD-1549 - Common Termination System for Electrical and Electronic Parts (No Superseding Document)
- MIL-STD-1580 - Destructive Physical Analysis for Electronic, Electromagnetic, and Electromechanical Parts
- MIL-STD-1631 - Procedure for Selection of Electronic and Electrical Parts and Materials During Design of Military Items (See MIL-STD-965)
- MIL-STD-174 - Color for Coding Electronic Parts (Superseded by MIL-STD-1285)
- MIL-STD-202 - Test Method Standard for Electronic and Electrical Component Parts
- MIL-STD-202-101 - Method 101, Salt Atmosphere (Corrosion)
- MIL-STD-202-103 - Method 103, Humidity (Steady State)
- MIL-STD-202-104 - Method 104, Immersion
- MIL-STD-202-105 - Method 105, Barometric Pressure (Reduced)
- MIL-STD-202-106 - Method 106, Moisture Resistance
- MIL-STD-202-107 - Method 107, Thermal Shock
- MIL-STD-202-108 - Method 108, Life (at Elevated Ambient Temperature)
- MIL-STD-202-109 - Method 109, Explosion
- MIL-STD-202-110 - Method 110, Sand and Dust
- MIL-STD-202-111 - Method 111, Flammability (External Flame)
- MIL-STD-202-112 - Method 112, Seal
- MIL-STD-202-201 - Method 201, Vibration
- MIL-STD-202-203 - Method 203, Random Drop
- MIL-STD-202-204 - Method 204, Vibration, High Frequency
- MIL-STD-202-206 - Method 206, Life (Rotational)
- MIL-STD-202-207 - Method 207, High Impact Shock
- MIL-STD-202-208 - Method 208, Solderability
- MIL-STD-202-209 - Method 209, Radiographic Inspection
- MIL-STD-202-210 - Method 210, Resistance to Soldering Heat
- MIL-STD-202-211 - Method 211, Terminal Strength
- MIL-STD-202-212 - Method 212, Acceleration
- MIL-STD-202-213 - Method 213, Shock (Specified Pulse)
- MIL-STD-202-214 - Method 214, Random Vibration
- MIL-STD-202-215 - Method 215, Resistance to Solvents
- MIL-STD-202-217 - Method 217, Particle Impact Noise Detection (PIND)
- MIL-STD-202-218 - Method 218, Board Flex
- MIL-STD-202-219 - Method 219, Shear Stress
- MIL-STD-202-220 - Method 220, Ultrasonic Inspection
- MIL-STD-202-301 - Method 301, Dielectric Withstanding Voltage
- MIL-STD-202-302 - Method 302, Insulation Resistance
- MIL-STD-202-303 - Method 303, DC Resistance
- MIL-STD-202-304 - Method 304, Resistance-Temperature Characteristic
- MIL-STD-202-305 - Method 305, Capacitance
- MIL-STD-202-306 - Method 306, Quality Factor (Q)
- MIL-STD-202-307 - Method 307, Contact Resistance
- MIL-STD-202-308 - Method 308, Current-Noise Test for Fixed Resistors
- MIL-STD-202-309 - Method 309, Voltage Coefficient of Resistance Determination Procedure
- MIL-STD-202-310 - Method 310, Contact-Chatter Monitoring
- MIL-STD-202-311 - Method 311, Life, Low Level Switching
- MIL-STD-202-312 - Method 312, Life, Intermediate Current Switching
- MIL-STD-242 - Electronic Equipment Parts Selected Standards Crystals, Delay Lines, Coils, and Transformers (Superseded by MIL-STD-683, MIL-STD-1837, MIL-STD-1286)
- MIL-STD-242/1 - Electronic Equipment Parts Selected Standards Synchros, Blowers, and Acoustical Parts (Superseded by MIL-STD-710, MIL-B-23071, MIL-STD-2115)
- MIL-STD-242/10 - Wire and Cable (Part 10) (No Superseding Document)
- MIL-STD-242/11 - Electronic Equipment Parts Selected Standards, Radio Frequency Components (No Superseding Document)
- MIL-STD-242/12 - ELECTRONIC EQUIPMENT PARTS SELECTED STANDARDS HARDWARE and INSULATORS PART 12 (NO SUPERSEDING DOCUMENT)
- MIL-STD-242/2 - Electronic Equipment Parts Selected Standards Crystals, Delay Lines, Coils, and Transformers (No Superseding Document)
- MIL-STD-242/3 - Electronic Equipment Parts Selected Standards Resistors (Superseded by MIL-STD-199)
- MIL-STD-242/4 - Electronic Equipment Parts, Selected Standards Capacitors (Superseded by MIL-STD-198)
- MIL-STD-242/5 - ELECTRONIC EQUIPMENT PARTS, SELECTED STANDARDS, MICROCIRCUITS and SEMICONDUCTORS (SUPERSEDED BY MIL-STD-1562 and MIL-STD-701)
- MIL-STD-242/6 - Electronic Equipment Parts Selected Standards Relays (Part 6), (Superseded by MIL-STD-1346)
- MIL-STD-242/7 - Electronic Equipment Parts, Selected Standards Switches (Superseded by MIL-STD-1132)
- MIL-STD-242/8 - Electronic Equipment Parts Selected Standards Connectors and Sockets - Part 8 (No Superseding Document)
- MIL-STD-242/9 - Electronic Equipment Parts Selected Standards Circuit Breakers, Fuses, Lamps, and Meters (Superseded by MIL-L-3661, MIL-L-6363, MIL-L-15098, A-A-50454, A-A-50588, MIL-STD-1279, MIL-M-7793, MIL-STD-1498, and MIL-STD-1360)
- MIL-STD-242/COMPLETE - Complete Set of Slash Sheets for MIL-STD-242
- MIL-STD-439 - Electronic Circuits (No Superseding Document)
- MIL-STD-441 - Reliability of Military Electronic Equipment (Superseded by MIL-STD-785)
- MIL-STD-701 - Lists of Standard Semiconductor Devices (Superseded by MIL-HDBK-5961)
- MIL-STD-749 - Preparation and Submission of Data for Approval of Nonstandard Parts (See MIL-STD-965)
- MIL-STD-790 - Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications
- MIL-STD-975 - Nasa Standard Electrical, Electronic, and Electromechanical (Eee) Parts List (No Superseding Document)
- MIL-T-38106 - Test Carrier for Electronic Component Parts, General Specification For
- MIL-T-4734 - TRANSIT CASES, COMBINATION CASES AND SPARE PARTS CASES FOR GROUND ELECTRONIC EQUIPMENT (USAF) (REQUIREMENTS FOR) (SUPERSEDED BY MIL-C-4150 and MIL-C-5584)
- MS-27311 - Test Carrier, Stick Type, Three Terminal Device (No Superseding Document)
- MS-27312 - Test Carrier, Stick Type, Two-Terminal Device (No Superseding Document)
- MS-27313 - Test Carrier, Wafer Type Micro-Electronic Functional Device, Fourteen Terminal (No Superseding Document)
- MS-27314 - Test Carrier, Wafer Type, Three Terminal, .215 Diameter (No Superseding Document)
- MS-27315 - Test Carrier, Wafer Type Three Terminal, .760 Diameter (No Superseding Document)
- MS-27316 - Base,Test Carrier Assembly, Wafer Type
- MS-27317 - Test Carrier Liner, Two Terminal Device
- MS-27318 - Test Carrier Liner, Three Terminal Device (No Superseding Document)
- MS-27319 - Component Release Tool and Liner Removal Tool, Component Test Carrier, Two Terminal Device
- MS-27320 - Component Release Tool and Liner Removal Tool, Component Test Carrier, Three Terminal Device
- MS-27321 - Tray, Component Carrier Stick (No Superseding Document)
- MS-27322 - Tray, Transistor Carrier Stick
- MS-27323 - Insert Tray, Wafer
- MS-27324 - Spacer, Carrier Stick
- MS-27325 - Window, Carrier Stick
- MS-27326 - Lid, Carrier Stick
- MS-27327 - Cover, Carrier Stick
- MS-27358 - Spacer, Test Carrier Assembly, Matrix Type
- MS-27359 - Test Carrier Assembly, Matrix Type
- MS-27360 - Test Carrier Assembly, Matrix Type
- MS-27361 - Test Carrier Assembly, Matrix Type
- QPL-15733 - Filters and Capacitors, Radio Frequency Interference, General Specification for
- QPL-28861 - Filters and Capacitors, Radio Frequency/Electromagnetic Interference Suppression, General Specification For
- QPL-83401 - Resistor Networks, Fixed, Film, and Capacitor-Resistor Networks, Ceramic Capacitor and Fixed Resistors, General Specification for
- SS-EN-1280-1-AM1 - Agent specific filling systems for anaesthetic vaporizers - Part 1: Rectangular keyed filling systems
- SS-EN-12801-AM1 - Footwear - Test methods for insoles, lining and insocks - Perspiration resistance
- SS-EN-12802 - Road marking materials - Laboratory methods for identification