ASTM-F1239 › Complete Document History
Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)


Obsolete Revision Information:
   2002 EDITION - OXYGEN REDUCTION, STANDARD TES - Jan. 10, 2002
   1994 EDITION - OXYGEN PRECIPITATION CHARACTER - Aug. 15, 1994
   1989 EDITION - OXYGEN PRECIPITATION CHARACTER - Aug. 25, 1989