ASTM-F1596 › Complete Document History
Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity (Withdrawn 2024)


Obsolete Revision Information:
   WITHDRAWN - WITHDRAWN WITHOUT SUPERCEDING - Jan. 5, 2024
   2015 EDITION - Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity - July 15, 2015
   2007 EDITION - Exposure of Membrane Switches to Temperature and Relative Hu - Dec. 1, 2007
   2000 R05 EDITION - REAPPROVED IN 2005 - May 1, 2005
   2000 EDITION - Exposure of Membrane Switches to Temperature and Relative Hu - Dec. 10, 2000
   1995 EDITION - Exposure of Membrane Switches to Temperature and Relative Hu - April 15, 1995