ASTM-F744 › Historical Revision Information
Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits, Standard Test Meth

ASTM-F744 - 1981 R87(E1) EDITION - SUPERSEDED
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Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits, Standard Test Meth


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Document Number

ASTM-F744-81(1987)e1

Revision Level

1981 R87(E1) EDITION

Status

Superseded

Publication Date

Oct. 30, 1981

Page Count

8 pages