ASTM-F744 › Historical Revision Information
Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits, Standard Test Meth

ASTM-F744 - DOD ADOPTION - SUPERSEDED
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Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits, Standard Test Meth


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FSC 5962 (Microcircuits, Electronic)

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Document Number

ASTM-F744

Revision Level

DOD ADOPTION

Status

Superseded

Publication Date

Sept. 13, 2000

Page Count

1 page