BS-EN-15991 › Historical Revision Information
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

BS-EN-15991 - 2011 EDITION - SUPERSEDED
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Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Keywords

Particulate materials,Silicon inorganic compounds,Vaporization,Emission spectrophotometry,Ceramics,Determination of content,Trace element analysis,Impurities,Carbides,Chemical analysis and testing,Refractory materials,Raw materials

To find similar documents by classification:

81.060.10 (Raw materials)

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Document Number

BS EN 15991:2011

Revision Level

2011 EDITION

Status

Superseded

Publication Date

Feb. 28, 2011

Replaced By

BS EN 15991:2015

Page Count

32

ISBN

9780580641800

International Equivalent

EN 15991:2011

Committee Number

RPI/1