BS-EN-190000 › Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
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Keywords
Dimensions;Accelerated testing;Capability approval;Circuits;Defects;Solderability testing;Symbols;Assessed quality;Surface defects;Endurance testing;Specification (approval);Approval testing;Thermal testing;Electronic equipment and components;Quality control;Quality assurance systems;Marking;Test specimens;Vibration testing;Damp-heat tests;Environmental testing;Monolithic integrated circuits;Acceleration tests;Integrated circuits;Electrical testing;Formulae (mathematics);Testing conditions;Definitions;Visual inspection (testing);Impact testing;Inspection;Qualification approval;Detail specification;Orientation;Mechanical testing;Leak tests
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Document Number
BS EN 190000:1996
Revision Level
1996 EDITION
Status
Current
Publication Date
March 15, 1996
Replaces
01-0000000000;BS CECC 90000:1991
Page Count
206
ISBN
0580252116
International Equivalent
EN 190000:1995
Committee Number
EPL/47