BS-EN-60444-8 › Historical Revision Information
Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units

BS-EN-60444-8 - 2003 EDITION - SUPERSEDED
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Measurement of quartz crystal unit parameters

Keywords

Calibration;Electrical measurement;Electronic equipment and components;Circuits;Frequencies;Piezoelectric devices;Resonators;Dielectric devices;Electrical wave measurement;Crystal resonators;Crystals (electronic);Electrical equipment;Quartz;Phase measurement (electric);Electrical properties and phenomena

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31.140 (Piezoelectric devices)

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Document Number

BS EN 60444-8:2003

Revision Level

2003 EDITION

Status

Superseded

Publication Date

Nov. 19, 2003

Replaces

PD IEC/PAS 62277:2002

Replaced By

BS EN 60444-8:2017

Page Count

14

ISBN

0580429539

International Equivalent

EN 60444-8 (IEC 60444-8:2003) AS;IEC 60444-8:2003

Committee Number

W/-