BS-ISO-14701 › Historical Revision Information
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Keywords
Silicon;Surface chemistry;Surface properties;X-ray photoelectron spectroscopy;Chemical analysis and testing;Thickness measurement;Electron emission;Photoelectron spectroscopy;Oxides;Spectroscopy
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS ISO 14701:2011
Revision Level
2011 EDITION
Status
Superseded
Publication Date
Aug. 31, 2011
Replaced By
BS ISO 14701:2018
Page Count
24
ISBN
9780580696244
International Equivalent
ISO 14701:2011
Committee Number
CII/60