BS-ISO-24173 › Historical Revision Information
Microbeam Analysis, Guidelines for Orientation Measurement Using Electron Backscatter
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Keywords
Electron beams;Microanalysis;Test specimens;Orientation;Measurement;Diffraction;Chemical analysis and testing;Crystallography;Crystal structure;Electron microscopes
To find similar documents by classification:
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS ISO 24173:2009
Revision Level
2009 EDITION
Status
Superseded
Publication Date
Oct. 31, 2009
Replaced By
BS ISO 24173:2024
Page Count
54
ISBN
9780580553974
International Equivalent
ISO 24173:2009
Committee Number
CII/9