BS-ISO-25498 › Historical Revision Information
Microbeam Analysis, Analytical Electron Microscopy, Selected-Area Electron Diffraction

BS-ISO-25498 - 2010 EDITION - SUPERSEDED
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Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

Keywords

Microanalysis;Test specimens;Electron microscopes;Spectroscopy;Optical instruments;Electron beams;Electron diffraction;Crystal lattices;Chemical analysis and testing

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71.040.50 (Physicochemical methods of analysis Including spectrophotometric and chromatographic analysis)

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Document Number

BS ISO 25498:2010

Revision Level

2010 EDITION

Status

Superseded

Publication Date

June 30, 2010

Replaced By

BS ISO 25498:2018

Page Count

40

ISBN

9780580578533

International Equivalent

ISO 25498:2010

Committee Number

CII/9