DESC-DWG-5962-91746 | Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal Buffer, Inverting Three-State Outputs, Monolithic Silicon | Document Center, Inc.

DESC-DWG-5962-91746 › Complete Document History
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal Buffer, Inverting Three-State Outputs, Monolithic Silicon

Complete Current Edition:

REVISION C - Inverting Three-State Outputs, Monolithic Silicon - Sept. 27, 2021

Obsolete Revision Information:

   REVISION B - Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal Buffer, Inverting Three-State Outputs, Monolithic Silicon - April 20, 2015
   REVISION A - THREE-STATE OUTPUTS, MONOLITHIC SILICON - Nov. 17, 2008
   BASE - MICROCIRCUIT, DIGITAL, BIPOLAR - June 10, 1994