DESC-DWG-5962-94586 › Complete Document History
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device, Octal Bus Transceiver and Register, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon, CORRECTLY NUMBERED DESC-SMD-5962-94586
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REVISION B - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Devi - June 30, 2014
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Obsolete Revision Information: |
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REVISION A - Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Devi - May 3, 2007
BASE - MICROCIRCUIT, DIGITAL, ADVANCE - April 22, 1994 |