DIN-EN-60749-40 › Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

DIN-EN-60749-40 - 2012 EDITION - CURRENT



Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge


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Document Number

DIN-EN-60749-40

Revision Level

2012 EDITION

Status

Current

Publication Date

Feb. 1, 2012