DSCC-V62/04730 › Historical Revision Information
Microcircuit, Digital, Advanced Bipolar CMOS, 3.3-V ABT Scan Test Device with 18-Bit Universal Bus Transceiver, Monolithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, 3.3-V ABT Scan Test Device with 18-Bit Universal Bus Transceiver, Monolithic Silicon
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FSC 5962 (Microcircuits, Electronic)
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Document Number
DSCC-V62/04730
Revision Level
BASE
Status
Superseded
Publication Date
June 9, 2004
Page Count
21 pages