IEC-60749-27-AM1 | Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) | Document Center, Inc.

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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Obsolete Revision Information:

ED. 2.0 AMENDMENT 1 - AMENDMENT 1 FOR EDITION 2.0 - Sept. 25, 2012