IEC-60749-29 › Complete Document History
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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EDITION 2.0 - PART 29: LATCH-UP TEST, SEMICONDUCTOR DEVICES - MECHANICAL & - April 1, 2011
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Obsolete Revision Information: |
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1ST EDITION - PART 29: LATCH-UP TEST, SEMICO - Nov. 1, 2003
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