IEC/PAS-61338-1-5 › Historical Revision Information
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC/PAS-61338-1-5 - REPLACED BY IEC-61338-1 - SUPERSEDED -- See the following: IEC-61338-1
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IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.
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Document Number

IEC/PAS-61338-1-5

Revision Level

REPLACED BY IEC-61338-1

Status

Superseded

Publication Date

June 1, 2015

Committee Number

49