ISO-11505 › Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
ISO-11505
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1ST EDITION
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CURRENT
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ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
ISO 11505:2012
Revision Level
1ST EDITION
Status
Current
Publication Date
Dec. 15, 2012
Committee Number
ISO/TC 201/SC 8