ISO-14975 › Surface chemical analysis -- Information formats

ISO-14975 - 1ST EDITION - CURRENT


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This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

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Document Number

ISO 14975:2000

Revision Level

1ST EDITION

Status

Current

Publication Date

Dec. 1, 2000

Committee Number

ISO TC 201/SC 3/WG 1