ISO-24173 › Historical Revision Information
Microbeam Analysis - Guidelines for Orientation Measurement Using Electron Backscatte
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ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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Document Number
ISO 24173:2009
Revision Level
1ST EDITION
Status
Superseded
Publication Date
Sept. 1, 2009
Committee Number
ISO/TC 202