ISO-24173 › Historical Revision Information
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
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This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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Document Number
ISO 24173:2024
Revision Level
2ND EDITION
Status
Current
Publication Date
Feb. 1, 2024
Committee Number
ISO/TC 202