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Corrigendum
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Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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17.040.30 (Measuring instruments)
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Document Number
ISO 3274/Cor1:1998
Revision Level
2ND EDITION CORRIGENDUM 1
Status
Current
Publication Date
June 1, 1998
Committee Number
ISO TC 213