JESD-47 › Historical Revision Information
Stress-Test-Driven Qualification of Integrated Circuits
Stress-Test-Driven Qualification of Integrated Circuits
Abstract
The standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
This qualification standard is not aimed at extreme use conditions such as military applications, automotive under-the-hood applications, or uncontrolled avionics environments, nor does it address 2nd level reliability considerations, which are addressed in JEP150.
Tables in the standard list qualification requirements not only for new components but also for a qualification family or category of change. It is expected that the IC sampling lot will pass all appropriate qualification tests derived from these tables.
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Document Number
JESD47C
Revision Level
REVISION C
Status
Superseded
Publication Date
Nov. 1, 2004
Page Count
28 pages